Stratix® IV デバイス・ハンドブック、第 1 巻、第 12 章: JTAG バウンダリースキャン・テスト

Describes the error detection cyclical redundancy check (CRC) and SEU Mitigation in Stratix® IV Devices

Stratix® IV Device Transceivers

This section provides a description of transceiver architecture and transceiver clocking for the Stratix® IV device family. It also describes configuring for multiple protocols and data rates, reset control and power down, and dynamic configuration for Stratix IV devices.

Which configuration schemes are supported and how to execute required configuration schemes.