Stratix® IV デバイス・ハンドブック、第 1 巻、第 11 章: SEU の緩和

Describes IEEE 1149.1 (JTAG) Boundary-Scan Testing in Stratix® IV Devices

This section provides a description of transceiver architecture and transceiver clocking for the Stratix® IV device family. It also describes configuring for multiple protocols and data rates, reset control and power down, and dynamic configuration for Stratix IV devices.

Which configuration schemes are supported and how to execute required configuration schemes.

Describes hot socketing and power-on reset in Stratix® IV Devices